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Dynamic random-access memory
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461	DC Express: Shortest Latency Protocol for Reading Phase Change Memory over PCI Express Dejan Vučinić, Qingbo Wang, Cyril Guyot, Robert Mateescu, Filip Blagojević, Luiz Franca-Neto, and Damien Le Moal, HGST San Jose Re Add to Reading List Source URL: www.usenix.org Language: English - Date: 2014-10-28 21:41:11 Computer buses PCI Express Solid-state drive IOPS Dynamic random-access memory Computer data storage Conventional PCI Latency Direct memory access Computer hardware Computing Computer memory
462	DRAMA – MINOR College ............................ Arts and Sciences Academic Award[removed]Minor Credits Required[removed]semester credits Coordinator ..................... Darrell Hobson DRAMA MINOR REQU Add to Reading List Source URL: www.northwestu.edu Language: English - Date: 2013-08-22 18:35:05 Armenian dram Dram Measurement Computer memory Dynamic random-access memory
463	U.S. DISTRICT COURT FOR THE NORTHERN DISTRICT OF CALIFORNIA If You Bought Computers, Printers, Video Game Consoles, DRAM Modules or Other Devices with Memory You Could Get Money from a $310 Million Settlement. A Federal Add to Reading List Source URL: dramclaims.com Language: English - Date: 2014-02-24 12:35:15 Electronics Semiconductor companies Civil law Class action Dynamic random-access memory Rambus Lawsuit Parens patriae United States antitrust law Computer memory Computer hardware Technology
464	Bit Preservation: A Solved Problem? David S. H. Rosenthal Stanford University Libraries, CA Abstract For years, discussions of digital preservation have routinely Add to Reading List Source URL: lockss.org Language: English - Date: 2011-05-12 16:58:23 Information Data quality Data security Backup RAID Hard disk drive Computer data storage Dynamic random-access memory Reliability engineering Computer hardware Computing Computer storage media
465	Bit Preservation: A Solved Problem? 1 The International Journal of Digital Curation Issue 1, Volume 5 \| 2010 Bit Preservation: A Solved Problem? Add to Reading List Source URL: lockss.org Language: English - Date: 2011-05-12 16:55:54 RAID Backup Reliability engineering Dynamic random-access memory Digital preservation Computer data storage Standard RAID levels Hard disk drive Computer hardware Science Computing
466	PDF Document Add to Reading List Source URL: www.gettips.com Language: English - Date: 2012-04-19 13:51:23 Tort law Household chemicals Dram shop Liquor license Alcoholic beverage Liquor store Bar Dynamic random-access memory Alcohol Alcohol law Law
467	WIMS Tub Packing List – Base Kit Kit: Measurement Tote: 02 You have one week to report any missing/damaged items. You will be held responsible for returning all of the materials below. Remarks: ________________________ Add to Reading List Source URL: www.indianascience.org Language: English - Date: 2012-09-13 09:56:47 Drinkware Customary units in the United States Drug paraphernalia Medical equipment Syringe Vial Beaker Two-liter bottle Dynamic random-access memory Measurement Technology Imperial units
468	Date: August 2, 2004 Executive Brief Integration Drives Consumer Electronics Market For Storage Add to Reading List Source URL: www.tomcoughlin.com Language: English - Date: 2004-10-24 04:52:49 Computer peripherals Hard disk drive Embedded system Serial ATA Synchronous dynamic random-access memory Computer data storage Disk storage Firmware Solid-state drive Computer hardware Computer storage media Non-volatile memory
469	Memory Module Specifications KVR16N11S8/4 4GB 1Rx8 512M x 64-Bit PC3[removed]CL11 240-Pin DIMM DESCRIPTION Add to Reading List Source URL: www.kingston.com Language: English - Date: 2014-01-22 17:06:27 Computing Electronics DDR3 SDRAM Synchronous dynamic random-access memory Dynamic random-access memory DIMM CAS latency Memory module Nvidia Ion Computer memory SDRAM Computer hardware
470	STATIC COMPONENT INTERCONNECTION TEST TECHNOLOGY IN PRACTICE Frans de Jong, Rob Raaijmakers Philips Research, Philips CFT, The Netherlands Email: [removed], [removed] Steffen Hellmold Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2001-07-23 12:55:02 Electronics manufacturing Electronic design automation Boundary scan Hardware description languages Joint Test Action Group Design for testing Scan chain Synchronous dynamic random-access memory XNOR gate Electronic engineering Manufacturing Electronics

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